The angle-resolved X-ray photoelectron spectra for 0.15 monolayers (ML
) of sulfur, and 0.25 ML methyl thiolate formed at 100 K and annealed
to 150 and 250 K, on Ni(lll) are analyzed to determine the structures
of these species. It is found that sulfur adsorbs on the face-centered
cubic hollow site on Ni(111) with a S-Ni bond length of 2.20 +/- 0.02
Angstrom. The thiolate species formed at 150 K has the C-S bond tilte
d at similar to 35 degrees to the surface normal with a C-S bond lengt
h of 1.85 +/- 0.02. Angstrom and a S-Ni bond length similar to that fo
r adsorbed sulfur (2.2 Angstrom). The methyl group is tilted toward th
e bridge site and the thiolate appears to be adsorbed on the face-cent
ered cubic site although there may also be adsorption in the hexagonal
close packed site. The species formed at 250 K adsorbs on a reconstru
cted surface where the chemical shift of the S 2p core level indicates
that it adsorbs at a four-fold site and the angle-resolved XPS data i
ndicate that the C-S bond is oriented normal to the surface. The calcu
lated angular variations in intensity are consistent with this interpr
etation but cannot distinguish between the various models proposed for
the reconstructed surface. (C) 1997 Elsevier Science B.V.