Fatigue properties of lanthanum strontium manganate-lead zirconate titanate epitaxial thin film heterostructures produced by a chemical solution deposition method

Authors
McNally, F Kim, JH Lange, FF
Citation
F. Mcnally et al., Fatigue properties of lanthanum strontium manganate-lead zirconate titanate epitaxial thin film heterostructures produced by a chemical solution deposition method, J MATER RES, 15(7), 2000, pp. 1546-1550
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS RESEARCH
ISSN journal
08842914 → ACNP
Volume
15
Issue
7
Year of publication
2000
Pages
1546 - 1550
Database
ISI
SICI code
0884-2914(200007)15:7<1546:FPOLSM>2.0.ZU;2-8
Abstract
A liquid-precursor process was used to produce an epitaxial all-oxide ferro electric memory device structure. The lanthanum strontium manganate-lead zi rconate titanate-lanthanum strontium manganate (LSMO-PZT-LSMO) structure us ed for this device shows excellent polarization and fatigue behavior with a remnant polarization P-r of 42 mu C/cm(2) and a coercive field E-c of 68 k eV. The polarization was found to only slightly degrade after over 10(10) f atigue cycles. This behavior is contrasted with epitaxial PZT using a metal top electrode. In addition, the use of a top LSMO electrode was a sufficie nt barrier to Pb loss during heating to allow subsequent (or prolonged) hea t treatments that would generally lead to Pb loss.