The first (RF)mu SR data is presented on high-quality liquid-phase epitaxy
(LPE) grown GaAs, material known to have a defect concentration comparable
to its dopant levels. Our initial data on two n-type samples is compared to
results in commercial semi-insulating material and to the better understoo
d situation ill Si. Some preliminary interpretations are given. (C) 2000 El
sevier Science B.V. All rights reserved.