Peierls or Jahn-Teller effect in endohedrally doped silicon clathrates: AnEXAFS study

Citation
F. Brunet et al., Peierls or Jahn-Teller effect in endohedrally doped silicon clathrates: AnEXAFS study, PHYS REV B, 61(24), 2000, pp. 16550-16560
Citations number
55
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
61
Issue
24
Year of publication
2000
Pages
16550 - 16560
Database
ISI
SICI code
0163-1829(20000615)61:24<16550:POJEIE>2.0.ZU;2-Q
Abstract
The effect of doping silicon clathrate structures with sodium atoms has bee n investigated experimentally by x-ray photoemission and x-ray absorption s pectroscopies. Both techniques reveal a poor screening of the sodium atoms inside the silicon cages. We also discuss the sodium state that is intermed iate between the metal-like and the atomlike ones. These results are in agr eement with theoretical predictions of Demkov et al. and Smelyansky and Tse . In addition, the fine analysis of the extended x-ray absorption fine stru cture region reveals unambiguously a large displacement (0.9 +/- 0.2 Angstr om) of the sodium atom with respect to the center of the silicon cage. This displacement is higher than the one predicted by a simple Jahn-Teller effe ct and is discussed in terms of sodium pairing. The formation of dimers wit h covalent bonding is compared to the Peierls distortion in a monodimension al network.