X-ray scattering study of the Ge(001): Te(1X1) surface structure

Citation
O. Sakata et al., X-ray scattering study of the Ge(001): Te(1X1) surface structure, PHYS REV B, 61(24), 2000, pp. 16692-16696
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
61
Issue
24
Year of publication
2000
Pages
16692 - 16696
Database
ISI
SICI code
0163-1829(20000615)61:24<16692:XSSOTG>2.0.ZU;2-9
Abstract
The 1 x 1 surface structure of Te adsorbed on Ge(001) was studied by analyz ing the x-ray scattered intensity along several surface crystal truncation rods (CTR). The results were compared to simulations corresponding to the b ridge, top, antibridge, and hollow site models. Te at the bridge site was i n best agreement. More complex surface models based an modifications of Te at the bridge site were then compared to the data with the missing-row mode l being in better agreement than the zigzag model. Finally, the CTR data we re used to refine the structural parameters of the missing row model.