The critical behavior of thin FeCo films grown on MgO has been studied usin
g phase-sensitive synchrotron x-ray diffractian. These studies unravel seve
ral novel features of criticality in thin films, as the simultaneous appear
ance of the 3D-2D crossover and the truncation of the correlation length no
rmal to the film at approximately 1/3 of the film thickness. Above the crit
ical temperature of the film we observe a pronounced pinning of the order p
arameter at the MgO-FeCo interface, which indicates a novel critical adsorp
tion behavior.