Use of displacement damage dose in an engineering model of GaAs solar cellradiation damage

Citation
Tl. Morton et al., Use of displacement damage dose in an engineering model of GaAs solar cellradiation damage, PROG PHOTOV, 8(3), 2000, pp. 339-343
Citations number
8
Categorie Soggetti
Environmental Engineering & Energy
Journal title
PROGRESS IN PHOTOVOLTAICS
ISSN journal
10627995 → ACNP
Volume
8
Issue
3
Year of publication
2000
Pages
339 - 343
Database
ISI
SICI code
1062-7995(200005/06)8:3<339:UODDDI>2.0.ZU;2-D
Abstract
In this study we have combined a method of calculating radiation induced da mage to solar cells using Non-Ionizing Energy Loss (NIEL), with models of E ar rh orbiting radiation in arbitrary orbits, to assess the lifetime of sol ar cells. This paper provides a comparison of the NIEL technique to results from the JPL Radiation Handbook, and to actual space experimental damage r esults. In addition, we discuss ways of extending the calculation to newel solar cell materials, as well as environments outside of the Earth's orbit. Copyright (C) 2000 John Wiley & Sons, Ltd.