Ion-implantation followed by etching was used to fabricate micromachine com
ponents from bulk silicon. The size of the ion-modified region was sufficie
ntly small to make microdevices (e.g. devices with submicrometer dimensions
). Ion implantation/etching techniques have the advantages of high controll
ability, high selectivity and non-thermal processing. For 3.1 MeV gold ions
implanted into silicon to a dose of 1 x 10(17) cm(-2), microcantilever bea
ms were fabricated with a Young's modulus of 60 GPa and a surface resistanc
e of 36 k Omega. The elastic property was lower than conventional materials
used for making microdevices, and the electrical resistance was sufficient
ly low that such components can be used as electrical conductors. (C) 2000
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