Titanium aluminide alloys based on gamma-TiAl have a substantial potential
for high-temperature applications. However, there are still problems concer
ning the high-temperature oxidation behavior. Ion implantation is a promisi
ng tool for improving the oxidation resistance without disturbing the mecha
nical properties. A systematic investigation of the microstructure and phas
e development of silicon- and molybdenum-implanted gamma-TiAl is presented.
For Si, the fluence is varied from 2.5 x 10(16) to 8 x 10(17) cm(-2) at an
implantation energy of 1 MeV resulting in a local concentration of Si betw
een 1 and 35 at.% at a projected range of 1 mu m, measured by AES depth pro
filing. Grazing incidence XRD and transmission electron microscopy show the
formation of a buried Ti5Si3 enriched laver at 650 degrees C, which acts a
s a diffusion barrier for oxygen. Long-term TGA oxidation tests at 900 degr
ees C in air show a positive effect in the beginning of oxidation for the f
luence of 8 x 10(17) Si cm(-2). After a few hours the oxidation kinetics is
similar to unimplanted Ti50Al. but the mass gain after 100 h is still 30%
smaller. The influence of the local Si concentration on the oxidation behav
ior is discussed. Implantation of Mo at 180 keV (2 x 10(16) and 1 x 10(17)
cm(-2)) has only a minor influence on the oxidation at 900 degrees C. After
implantation, Mo precipitates are found for the high fluence. (C) 2000 Els
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