Growth of silicon nanostructures on graphite

Citation
P. Scheier et al., Growth of silicon nanostructures on graphite, SURF SCI, 458(1-3), 2000, pp. 113-122
Citations number
38
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
458
Issue
1-3
Year of publication
2000
Pages
113 - 122
Database
ISI
SICI code
0039-6028(20000620)458:1-3<113:GOSNOG>2.0.ZU;2-3
Abstract
Silicon nanostructures such as small clusters, superclusters, and elongated chains, with an average diameter of a few nanometers. have been synthesize d by magnetron sputtering on cleaved highly oriented pyrolytic graphite (HO PG). Scanning tunneling microscopy (STM) reveals that flat, defect-poor are as of the HOPG surface are covered with almost uniformly sized silicon clus ters of 0.6+/-0.2 nm, 5.1+/-1.2 nm, and 15.4+/-3 nm diameter. Surface regio ns with defects such as pits and craters, descending a few layers into the graphite surface, are sparsely covered with silicon. Most of the deposited material, with an average diameter of 2 nm, is found to be attached to the monatomic step edges forming the crater rims. A simulation of the growth pr ocess, i.e. deposition of silicon atoms onto a surface with built-in defect s, and subsequent surface diffusion and aggregation of the adatoms, convinc ingly reproduces most of the Si nanostructures observed in the STM topograp hs. (C) 2000 Elsevier Science B.V. All rights reserved.