Atomic force microscopy and scanning electron microscopy study of MgO(110)surface faceting

Citation
Dr. Giese et al., Atomic force microscopy and scanning electron microscopy study of MgO(110)surface faceting, SURF SCI, 457(3), 2000, pp. 326-336
Citations number
16
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
457
Issue
3
Year of publication
2000
Pages
326 - 336
Database
ISI
SICI code
0039-6028(20000610)457:3<326:AFMASE>2.0.ZU;2-3
Abstract
Phosphoric- and nitric-acid etching of the MgO(110) surface generates vicin al faceting in both the < 001 > and < 110 > directions. Vacuum annealing (t o 1000 degrees C) does not introduce thermal faceting, and does not alter t he chemical-etch morphology. Three types of acid-induced faceting (early-st age pits, later-stage grooves, and inverted trapezoidal pyramids) are seen as a function of etching time. Facet-angle analysis by atomic force microsc opy (AFM) and scanning electron microscopy (SEM) shows the etch morphology to be vicinal, with angles in the range of 9 degrees to 23 degrees, not the low-energy {100} planes expected from minimization of surface energy. (C) 2000 Elsevier Science B.V. All rights reserved.