GROWTH OF INN AT HIGH-TEMPERATURE BY HALIDE VAPOR-PHASE EPITAXY

Citation
N. Takahashi et al., GROWTH OF INN AT HIGH-TEMPERATURE BY HALIDE VAPOR-PHASE EPITAXY, JPN J A P 2, 36(6B), 1997, pp. 743-745
Citations number
9
Categorie Soggetti
Physics, Applied
Volume
36
Issue
6B
Year of publication
1997
Pages
743 - 745
Database
ISI
SICI code
Abstract
Epitaxial growth of InN at high temperature was tried on a GaN buffer/ (0001)sapphire substrate by halide vapor phase epitaxy using InCl3 and NH3 sources. An InN epitaxial layer was obtained reproducibly at a gr owth temperature as high as 750 degrees C. The growth rate of hexagona l InN was 0.2 mu m/h at 750 degrees C. The X-ray full width at half-ma ximum (FWHM) value of the obtained InN showed a minimum (24.7 min) at the growth temperature of 700 degrees C. It was found that a high inpu t partial pressure of InCl3 nas necessary for the growth of InN at hig h temperature.