X. Liang et al., Electric force microscopy study of the surface electrostatic property of rubbed polyimide alignment layers, THIN SOL FI, 370(1-2), 2000, pp. 238-242
Two polyimides were synthesized for use as alignment layers. The pretilt an
gles of the liquid crystals, 4-cyano-4'-n-pentylbiphenyl, on the two polyim
ides were measured by the crystal rotation method. The relative surface ato
mic concentrations of F/C (%) were measured by Xray photoelectron spectrosc
opy. Electric force microscopy was utilized to investigate the surface elec
trostatic property of the two thin polyimide alignment layers before and af
ter rubbing. All results demonstrate that rubbing causes trifluoromethyl mo
ieties to migrate towards the surface, absorb negative charges and orient a
long the rubbing direction. Thus, it is proposed that distributions of func
tional groups on the surface of the polyimide after rubbing are anisotropic
and the van der Waals forces between the polar groups and liquid crystal m
olecules play an important role in the uniform orientation of the liquid cr
ystal molecules. (C) 2000 Published by Elsevier Science S.A. All rights res
erved.