Experimental study of a surfactant-assisted SiGe graded layer and a symmetrically strained Si/Ge superlattice for thermoelectric applications

Citation
Jl. Liu et al., Experimental study of a surfactant-assisted SiGe graded layer and a symmetrically strained Si/Ge superlattice for thermoelectric applications, THIN SOL FI, 369(1-2), 2000, pp. 121-125
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
369
Issue
1-2
Year of publication
2000
Pages
121 - 125
Database
ISI
SICI code
0040-6090(20000703)369:1-2<121:ESOASS>2.0.ZU;2-I
Abstract
A method to grow high-quality SiGe graded buffer layer is presented. The ma in concept of the method is to use Sb as a surfactant when growing Sice gra ded layers. Compared with a Si0.5Ge0.5 graded sample without Sb surfactant, the Sb-assisted Si0.5Ge0.5 graded layer has much smoother surface and a si gnificantly lower threading dislocation density. Thermal conductivity of a symmetrically strained Si/Ge superlattice grown on Sb-assisted Si0.5Ge0.5 g raded layer is also presented. (C) 2000 Elsevier Science S.A. All rights re served.