We have investigated several growth concepts for strain relieved SiGe buffe
rs as basis for high frequency transistors. Modulation doped quantum wells
(MODQWs) were realized by molecular beam epitaxy (MBE) on top of thick grad
ed buffers prepared by MBE, ultra-high vacuum chemical vapor deposition (UH
VCVD) and low-energy plasma-enhanced CVD (LEPECVD). Additionally, thin buff
ers including a specific layer grown at low temperature (LT) were realized
entirely by MBE. The overgrown thick CVD samples show comparable transport
properties and thermal stabilities to those on thick graded MBE buffers. Mo
bilities of up to 90 000 cm(2)/V s have been measured at 30 K. Thin LT-MBE
structures show slightly worse properties but are superior to conventional
constant composition buffers. (C) 2000 Elsevier Science S.A. All rights res
erved.