B. Mutel et al., Characterization of a based h-BN thin film elaborated from the reaction between a flowing nitrogen plasma and B2H6, VIDE, 54(294), 1999, pp. 473-480
The reactivity of a nitrogen flowing microwave plasma is used to dissociate
diborane in order to deposit a thin film of hexagonal boron nitride on a s
ilicon substrate. Two reactive zones are tested : the far post-discharge an
d the secondary ionized zone. FTIR, Raman and XPS studies show unambiguousl
y the formation of h-Bn. But, films deposited in the first zone are not che
mically stable, while films deposited in the second one, free of B(2)O(3)an
d B(OH)(3) are quite stable. The influence of various durations of pre-trea
tment and post-treatment by the nitrogen plasma on the ageing of the coatin
g is also investigated.