Citation
Rl. Zheng et al., Rapid roughening of Mo2C film surface, ACT PHY C E, 49(7), 2000, pp. 1335-1343
Citations number
12
Categorie Soggetti
Physics
Journal title
ACTA PHYSICA SINICA
ISSN journal
10003290
→ ACNP
Volume
49
Issue
7
Year of publication
2000
Pages
1335 - 1343
Database
ISI
SICI code
1000-3290(200007)49:7<1335:RROMFS>2.0.ZU;2-U
Abstract
The roughness of Mo2C film surface is measured and the results are given. B
y introduction of crystalline boundary correction,the rapid roughening phen
omenon is explained theoretically.