Electric field-induced layer deformations in the subphases of an antiferroelectric liquid crystal device

The layer structure in the antiferroelectric, ferrielectric, and ferroelect ric phases of a liquid crystal device is reported, together with its electr ic field-induced deformation. The field-free chevron angle is comparable to the steric tilt angle, but differs significantly from the optical tilt ang le. A sharp field threshold is observed for the chevron to bookshelf transi tion in the antiferroelectric phase at 1.3 V/mu m, while layer deformations occur at much lower fields (0.3 V/mu m) in the other subphases. Models are proposed for the layer deformations. (C) 2000 American Institute of Physic s. [S0003-6951(00)00129-7].