Surface analytical facility at NPL, New Delhi

Citation
Br. Chakraborty et al., Surface analytical facility at NPL, New Delhi, CURRENT SCI, 78(12), 2000, pp. 1523-1527
Citations number
14
Categorie Soggetti
Multidisciplinary,Multidisciplinary
Journal title
CURRENT SCIENCE
ISSN journal
00113891 → ACNP
Volume
78
Issue
12
Year of publication
2000
Pages
1523 - 1527
Database
ISI
SICI code
0011-3891(20000625)78:12<1523:SAFANN>2.0.ZU;2-P
Abstract
The Surface Physics group at the National Physical Laboratory (NPL), New De lhi, has established different surface characterization facilities, viz. Lo w Energy Electron Diffraction (LEED), Electron Energy Loss Spectroscopy (EE LS), Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (X PS) and Secondary Ion Mass Spectrometry (SIMS). The group has been involved in studying the surface and interface of metals and semiconductors to unde rstand the bond formation, surface crystal structure, chemical states, impu rity profiles and interfacial diffusion, etc. using the above techniques. I n addition, this group is also involved in establishment of vacuum standard s down to a pressure of 10(-6) Pa. A few such recent case studies have been described briefly in this article.