The Surface Physics group at the National Physical Laboratory (NPL), New De
lhi, has established different surface characterization facilities, viz. Lo
w Energy Electron Diffraction (LEED), Electron Energy Loss Spectroscopy (EE
LS), Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (X
PS) and Secondary Ion Mass Spectrometry (SIMS). The group has been involved
in studying the surface and interface of metals and semiconductors to unde
rstand the bond formation, surface crystal structure, chemical states, impu
rity profiles and interfacial diffusion, etc. using the above techniques. I
n addition, this group is also involved in establishment of vacuum standard
s down to a pressure of 10(-6) Pa. A few such recent case studies have been
described briefly in this article.