Y. Dagan et al., [110] tunneling under applied magnetic fields into Y1Ba2Cu3O7-delta: Possible evidence for a field-induced id(xy) gap component, EUROPH LETT, 51(1), 2000, pp. 116-121
Tunneling characteristics along the [110] direction were measured in Y1Ba2C
u3O7-delta\Insulator\In junctions as a function of the magnetic field H, ap
plied parallel to the plane of the junction, along the c-axis. The junction
s exhibit a Zero Bias Conductance Peak (ZBCP) which splits as H-1/2. The da
ta is in better agreement with a field-induced id(xy) gap component than wi
th a Doppler-shift-induced field splitting.