[110] tunneling under applied magnetic fields into Y1Ba2Cu3O7-delta: Possible evidence for a field-induced id(xy) gap component

Citation
Y. Dagan et al., [110] tunneling under applied magnetic fields into Y1Ba2Cu3O7-delta: Possible evidence for a field-induced id(xy) gap component, EUROPH LETT, 51(1), 2000, pp. 116-121
Citations number
16
Categorie Soggetti
Physics
Journal title
EUROPHYSICS LETTERS
ISSN journal
02955075 → ACNP
Volume
51
Issue
1
Year of publication
2000
Pages
116 - 121
Database
ISI
SICI code
0295-5075(200007)51:1<116:[TUAMF>2.0.ZU;2-Q
Abstract
Tunneling characteristics along the [110] direction were measured in Y1Ba2C u3O7-delta\Insulator\In junctions as a function of the magnetic field H, ap plied parallel to the plane of the junction, along the c-axis. The junction s exhibit a Zero Bias Conductance Peak (ZBCP) which splits as H-1/2. The da ta is in better agreement with a field-induced id(xy) gap component than wi th a Doppler-shift-induced field splitting.