Evolution of dielectric permittivity under applied field in PLZT 8.3/70/30ceramics

Authors
Birks, E Kundzinsh, M Sternberg, A
Citation
E. Birks et al., Evolution of dielectric permittivity under applied field in PLZT 8.3/70/30ceramics, FERROELECTR, 240(1-4), 2000, pp. 1465-1471
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
FERROELECTRICS
ISSN journal
00150193 → ACNP
Volume
240
Issue
1-4
Year of publication
2000
Pages
1465 - 1471
Database
ISI
SICI code
0015-0193(2000)240:1-4<1465:EODPUA>2.0.ZU;2-K
Abstract
The jump of dielectric permittivity as function of bias field applied after various duration of storage at the measurement temperature is investigated . The influence of storage time on epsilon(E=) depends on the value of bias field and frequency of measuring field. It is found that epsilon(E=) depen ds on the path of how particular field value is reached.