Thick films on alumina substrates for piezoelectric devices applications

Citation
S. Le Dren et al., Thick films on alumina substrates for piezoelectric devices applications, FERROELECTR, 238(1-4), 2000, pp. 791-798
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
FERROELECTRICS
ISSN journal
00150193 → ACNP
Volume
238
Issue
1-4
Year of publication
2000
Pages
791 - 798
Database
ISI
SICI code
0015-0193(2000)238:1-4<791:TFOASF>2.0.ZU;2-Y
Abstract
PZT and Bismuth Titanate thick films on alumina substrate are prepared. Gra in size, temperature and time dependence of sintering is studied. Influence of PbO excess and atmosphere on piezoelectric properties is reported. For Bismuth Titanate materials high temperature measurements and deposits on me tallic substrate are carried out.