The domain patterns of (Ba,Sr)TiO3 thin epitaxial films were studied by rep
lica technique with respect to the degree of crystal structure perfection.
With increasing the structure defects density numerically estimated by micr
ostrain values, the transition to a relaxor-like microstructure occurred, i
t seems that the diffusivity of ferroelectric phase transition and other sp
ecific features characteristic of thin films of classic ferroelectrics, cou
ld be attributed to a co-existence of ferroelectric and relaxer phases in f
ilm volume.