Self-calibration of silicon photodiode in the soft X-ray spectral range

Authors
Zhang, DQ Cui, MQ Zhu, PP Zhao, YD Cui, CW
Citation
Dq. Zhang et al., Self-calibration of silicon photodiode in the soft X-ray spectral range, HIGH EN P N, 24(6), 2000, pp. 578-584
Citations number
10
Categorie Soggetti
Physics
Journal title
HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION
ISSN journal
02543052 → ACNP
Volume
24
Issue
6
Year of publication
2000
Pages
578 - 584
Database
ISI
SICI code
0254-3052(200006)24:6<578:SOSPIT>2.0.ZU;2-8
Abstract
Self-calibration experiment of silicon photodiodes in the soft X-ray spectr al region of synchrotron radiation (50-2000eV) is carried out. Because of e limination of "dead region" and adoption of very thin SiO2 layer as window of the silicon photodiode, a simple model can be used to analyze the proces s. Based on parameters measured by experiment, the quantum efficiency of th e silicon photodiode is calculated, and the flux of incident synchrotron ra diation is also obtained.