Calculation of exciton absorption in arbitrary layered semiconductor nanostructures with exact treatment of the Coulomb singularity

Citation
A. Ahland et al., Calculation of exciton absorption in arbitrary layered semiconductor nanostructures with exact treatment of the Coulomb singularity, IEEE J Q EL, 36(7), 2000, pp. 842-848
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
IEEE JOURNAL OF QUANTUM ELECTRONICS
ISSN journal
00189197 → ACNP
Volume
36
Issue
7
Year of publication
2000
Pages
842 - 848
Database
ISI
SICI code
0018-9197(200007)36:7<842:COEAIA>2.0.ZU;2-V
Abstract
An accurate finite-element exciton calculation is presented. The Coulomb si ngularity is exactly taken into account without any further assumptions bec ause analytical expressions are calculated for the Coulomb matrix elements even for the general three-dimensional case. Due to open boundary condition s, this is an accurate and fast model for calculating the optical propertie s of arbitrary semiconductor structures. The advantage will be demonstrated by an investigation of bulk, quantum-well, and multiquantum-well absorptio n.