Comparison of the resonance frequency of surface acoustic wave (SAW) r
esonators fabricated on defect-free and highly defective lithium tetra
borate wafers was attempted. The intrinsic variation of SAW velocity d
ue to crystal defects, impurities and chemical compositional inhomogen
eities for lithium tetraborate wafers is smaller than +/-0.011%. In ad
dition, the variation of SAW velocity in a wafer is influenced by the
device fabrication process rather than the lithium tetraborate substra
te quality.