SCANNING NONLINEAR DIELECTRIC MICROSCOPE USING A LUMPED CONSTANT RESONATOR PROBE AND ITS APPLICATION TO INVESTIGATION OF FERROELECTRIC POLARIZATION DISTRIBUTIONS

A new probe using a lumped constant resonator for the scanning nonline ar dielectric microscope has been developed. This probe has sufficient resolution to observe the area distribution of ferroelectric polariza tion. Using this probe, the distributions of the domains in the thin f ilm of a, copolymer of vinylidene fluoride and trifluoroethylene and i n a lithium niobate substrate with a titanium-diffused inversion layer are observed.