Gene effects for maydis leaf blight (Drechslera maydis) resistance and grain yield in white maize (Zea mays)

A study was conducted during 1996-98 on the gene effect for maydis leaf bli ght (Drechslera maydis) disease resistance and grain yield in exotic and in digenous white maize grain (Zen mays L.) from line x tester analysis. The e xperiment was conducted under artificial inoculation conditions. Combining ability analysis revealed that non-additive genetic variances were more imp ortant in the expression of disease resistance and high grain yield. There was no similarity in ranking between per-se performance and its correspondi ng. sca effects of the crosses. In general. it was found that resistance le vel of the crosses to maydis leaf blight disease was increased where both t he parents were having disease reaction resistant/least susceptible followe d by resistant x susceptible irrespective of incidence of male parents. Lin es L,, L-2, L-3 and tester T-1 were the best general combiners for disease resistance and high yield. L-2 x T-1 and L-3 x T-1 were the most desirable combinations having both high per-se performance and high sea effects for t he traits under study.