K. Endo et al., SPECTRAL-ANALYSIS OF 8 POLYMERS IN SIMS BY MO CALCULATION - PREDICTION OF CLEAVAGE OF POLYMERS AND STRUCTURAL FORMULA OF THE POSITIVE-ION FRAGMENT, Polymer Journal, 29(5), 1997, pp. 457-466
Spectra of eight polymers [(CH2-CHR)(n) (R=H, OH, F, Cl, OCH3, and CON
H2), (CF2-CF2)(n)] and (CH2-CHCN)(n) in time-of-flight (TOF)- and stat
ic(S)-secondary ion mass spectrometry (SIMS), respectively, were analy
zed by semiempirical and ab initio molecular orbital (MO) calculations
. We predicted where the cleavage of the polymers occurs on sputtering
, due to two-center bond energies of the model pentamers by a semiempi
rical MO calculations using AM1 program; a) the cleavage can occur in
any bonds (polyethylene, poly(vinyl methyl ether), polyacrylonitrile),
b)the cleavage of the main chain occurs in any bonds, after side chai
n groups cleaved first (poly(vinyl chloride, poly(acrylamide)), c) the
main chain carbons with the side chain group cleave at any bonds of t
he main chain (poly(vinyl fluoride, poly(tetrafluoroethylene), poly(vi
nyl alcohol)). We also determined the possible structural formulas of
the secondary positive-ion fragments in the range of 0-100 amu by ab i
nitio MO calculations using the HONDO7 program.