This paper presents a High-Level EDA environment based on the Hierarchical
Distributed BIST (HD-BIST), a flexible and reusable approach to solve BIST
scheduling issues in System-on-Chip applications. HD-BIST allows activating
and controlling different BISTed blocks at different levels of hierarchy,
with a minimum overhead in terms of area and test time. Besides the hardwar
e layer, the authors present the HD-BIST application layer, where a simple
modeling language, and a prototypical EDA tool demonstrate the effectivenes
s of the automation of the HD-BIST insertion in the test strategy definitio
n of a complex System-on-Chip.