A high-level EDA environment for the automatic insertion of HD-BIST structures

Citation
A. Benso et al., A high-level EDA environment for the automatic insertion of HD-BIST structures, J ELEC TEST, 16(3), 2000, pp. 179-184
Citations number
4
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
ISSN journal
09238174 → ACNP
Volume
16
Issue
3
Year of publication
2000
Pages
179 - 184
Database
ISI
SICI code
0923-8174(200006)16:3<179:AHEEFT>2.0.ZU;2-S
Abstract
This paper presents a High-Level EDA environment based on the Hierarchical Distributed BIST (HD-BIST), a flexible and reusable approach to solve BIST scheduling issues in System-on-Chip applications. HD-BIST allows activating and controlling different BISTed blocks at different levels of hierarchy, with a minimum overhead in terms of area and test time. Besides the hardwar e layer, the authors present the HD-BIST application layer, where a simple modeling language, and a prototypical EDA tool demonstrate the effectivenes s of the automation of the HD-BIST insertion in the test strategy definitio n of a complex System-on-Chip.