H. Manhaeve et al., Application of supply current testing to analogue circuits, towards a structural analogue test methodology, J ELEC TEST, 16(3), 2000, pp. 227-234
Citations number
11
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
This: paper describes work in progress towards the development, evaluation
and validation of a structural, cost effective and quantifiable analog and
mixed-signal test methodology, applicable in a production test environment
and bused on the application of supply current testing. To enable and suppo
rt the measurements at first an analog supply current monitor was realised.
The monitor offers a measurement range of 50 mA, a bandwidth of 1.5 MHz an
d a resolution better than 1 mu A. Subsequently the monitor was used to car
ry out measurements on a mixed-signal Asynchronous Digital Subscriber Line
(ADSL) ASIC, to evaluate the feasibility of the methodology. As these initi
al measurements provided very interesting results, the experiments towards
the validation and quantification of the test methodology are now being rep
eated on a larger scale. The results gathered so far show the potential of
the approach to enhance test quality combined with test cost reduction.