Application of supply current testing to analogue circuits, towards a structural analogue test methodology

Citation
H. Manhaeve et al., Application of supply current testing to analogue circuits, towards a structural analogue test methodology, J ELEC TEST, 16(3), 2000, pp. 227-234
Citations number
11
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
ISSN journal
09238174 → ACNP
Volume
16
Issue
3
Year of publication
2000
Pages
227 - 234
Database
ISI
SICI code
0923-8174(200006)16:3<227:AOSCTT>2.0.ZU;2-1
Abstract
This: paper describes work in progress towards the development, evaluation and validation of a structural, cost effective and quantifiable analog and mixed-signal test methodology, applicable in a production test environment and bused on the application of supply current testing. To enable and suppo rt the measurements at first an analog supply current monitor was realised. The monitor offers a measurement range of 50 mA, a bandwidth of 1.5 MHz an d a resolution better than 1 mu A. Subsequently the monitor was used to car ry out measurements on a mixed-signal Asynchronous Digital Subscriber Line (ADSL) ASIC, to evaluate the feasibility of the methodology. As these initi al measurements provided very interesting results, the experiments towards the validation and quantification of the test methodology are now being rep eated on a larger scale. The results gathered so far show the potential of the approach to enhance test quality combined with test cost reduction.