Experimental results on BIC sensors for transient current testing

In this work experimental results on a built-in current sensor for dynamic current testing, i(dd)(t), based on integration concepts are presented. The experimental validation proposed in this work is done through a VLSI CMOS circuit implemented in a 0.7 mu m technology. Different experiences have be en developed analyzing the detectability of several kind of defects through this technique. The encouraging results obtained present this technique as an attractive complement to boolean and I-DDQ testing.