This paper aims at defining an efficient test strategy for switched-current
circuit testing. Taking into account the specificity of these circuits, we
propose an original structural test technique as an alternative to traditi
onally-used Functional verification. This technique is validated both at th
e cell and block levels. Test results demonstrate that a high fault coverag
e can be achieved with a low cost test procedure. A mixed strategy combinin
g benefits of functional and structural approaches is derived.