M. Zhang et al., Alpha-decay damage and recrystallization in zircon: evidence for an intermediate state from infrared spectroscopy, J PHYS-COND, 12(24), 2000, pp. 5189-5199
alpha-decay damage and recrystallization in natural zircon (with dose rangi
ng from 0.06 to 23.3 x 10(18) alpha-events g(-1)) were studied using polari
zed reflection infrared spectroscopy. The experimental results show that al
pha-decay damage leads to a gradual decrease in reflectivity and a loss of
anisotropy of IR spectra. Recrystallization of damaged zircon is found as a
multi-stage process with a strong dependence on the initial degree of dama
ge. In weakly and moderately damaged samples the major recrystallization ta
kes place near 1000 K. Annealed samples recrystallize epitaxially along the
ir original crystallographic orientations. A highly damaged zircon with rad
iation dose of 15.9 x 10(18) alpha-events g(-1) decomposes into SiO2 and Zr
O2 near 1100 K. In this sample the growth of ZrSiO4 from the binary oxides
occurs between 1400 and 1500 K. An additional IR signal peaked near 790 cm(
-1) is detected in moderately damaged samples annealed at temperatures high
er than 800 K. This peak is sharp and isotropic. The peak tends to disappea
r at temperatures above 1400 K. This signal may be related to an unknown in
termediate phase caused by heating of radiation-damaged zircon. Alternative
ly, the signal may be due to the structural distortions near the boundaries
between the amorphized and crystalline regions.