A medium-energy ion scattering study of the Si(111)(root 3 x root 3)R30 degrees-Pb (beta-phase) surface

Authors
Spence, DJ Tear, SP Bailey, P Noakes, TCQ
Citation
Dj. Spence et al., A medium-energy ion scattering study of the Si(111)(root 3 x root 3)R30 degrees-Pb (beta-phase) surface, J PHYS-COND, 12(22), 2000, pp. 4699-4711
Citations number
27
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS-CONDENSED MATTER
ISSN journal
09538984 → ACNP
Volume
12
Issue
22
Year of publication
2000
Pages
4699 - 4711
Database
ISI
SICI code
0953-8984(20000605)12:22<4699:AMISSO>2.0.ZU;2-P
Abstract
The Si(111)(root 3 x root 3)R30 degrees-Pb reconstruction has been studied using medium-energy ion scattering. The ion scattering data were taken from two different scattering geometries and compared with Monte Carlo simulati ons of the scattering curves, varying different structural parameters syste matically until a suitable match between experiment and theory was obtained . A new structural model is proposed on the basis of these results.