The stability of thin film nanocomposites on silicon substrates, formed fro
m mixtures of a symmetric diblock copolymer blended with layered silicate n
anocomposites, was investigated using a combination of optical microscopy,
atomic force microscopy (AFM), and X-ray diffraction (XRD). Two cases exami
ned are polystyrene-b-poly(methyl methacrylate) (PS-b-PMMA) blended with mo
ntmorillonite, modified with stoichiometric amounts of alkylammonium surfac
tant chains, OLS(S), and PS-b-PMMA blended with montmorillonite, modified w
ith excess alkylammonium, OLS(E). While the phase behavior of the OLS(S)/co
polymer is similar to that observed in bulk studies, that bf the OLS(E)/cop
olymer system is different. We show that an exchange occurs between surfact
ant molecules in the OLS(E) system with copolymer chains and that the surfa
ctant molecules form a separate layer on the substrate, resulting in a dest
abilization of the film.