Characterization of film surface treated with ECR plasma by Doppler broadening

Doppler broadened positron annihilation measurements were carried out using the positron beam technique on plasma treated polyethylene films as a func tion of incident positron energy. In addition, surface properties of the tr eated films also have been measured using other conventional techniques suc h as ET-IR, SEM and AFM. The surface tension of the films was also determin ed using sessile drop method. The S-parameter is seen to decrease on the su rface upon plasma treatment that introduces polar groups such as hydroxyl a nd carbonyl on the surface. The results are discussed. (C) 2000 Elsevier Sc ience Ltd. All rights reserved.