Molecular marker technology linked to pest and pathogen resistance in wheat breeding

Citation
Am. Botha et E. Venter, Molecular marker technology linked to pest and pathogen resistance in wheat breeding, S AFR J SCI, 96(5), 2000, pp. 233-240
Citations number
139
Categorie Soggetti
Multidisciplinary,Multidisciplinary
Journal title
SOUTH AFRICAN JOURNAL OF SCIENCE
ISSN journal
00382353 → ACNP
Volume
96
Issue
5
Year of publication
2000
Pages
233 - 240
Database
ISI
SICI code
0038-2353(200005)96:5<233:MMTLTP>2.0.ZU;2-S
Abstract
Considerable advances in DNA marker technology in recent years have led to an increased understanding of the complexity of the wheat genome as well as the mapping of a large number of genes of interest. In the process, 60 loc i linked to disease and pest resistance have been mapped using different ma rker applications. Although restriction fragment length polymorphism marker s have been the basis for most of this work, useful markers have also been obtained using random amplified polymorphic DNA, sequence characterized amp lified regions, amplified fragment length polymorphisms and, most recently, simple sequence repeats. The next challenge facing breeders is the applica tion of these markers in breeding programmes.