Spectroscopic measurements on the Andreev reflection probability as a function of temperature

Authors
Appenzeller, J Jakob, M Stahl, H Knoch, J Lengeler, B
Citation
J. Appenzeller et al., Spectroscopic measurements on the Andreev reflection probability as a function of temperature, APPL PHYS L, 77(4), 2000, pp. 549-551
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
4
Year of publication
2000
Pages
549 - 551
Database
ISI
SICI code
0003-6951(20000724)77:4<549:SMOTAR>2.0.ZU;2-T
Abstract
The temperature dependence of the Andreev reflection coefficient A(E,T) at a superconductor/normal-metal interface is a key issue for the critical cur rent in a Josephson field-effect transistor at finite temperature. In this letter, we discuss our experimental observations of A(E,T) as a function of temperature determined by point contact spectroscopy. In addition, we poin t out major discrepancies between our findings and predictions from differe nt theoretical models. (C) 2000 American Institute of Physics. [S0003-6951( 00)02730-3].