Density of thin films of cadmium sulfide by nuclear backscattering

Authors
Durrani, SMA Al-Shukri, AM Khawaja, EE
Citation
Sma. Durrani et al., Density of thin films of cadmium sulfide by nuclear backscattering, AR J SCI EN, 25(2A), 2000, pp. 89-94
Citations number
16
Categorie Soggetti
Engineering Management /General
Journal title
ARABIAN JOURNAL FOR SCIENCE AND ENGINEERING
ISSN journal
03779211 → ACNP
Volume
25
Issue
2A
Year of publication
2000
Pages
89 - 94
Database
ISI
SICI code
0377-9211(200007)25:2A<89:DOTFOC>2.0.ZU;2-8
Abstract
The density of thin vapor-deposited films of cadmium sulfide was determined by spectrophotometry combined with Rutherford backscattering spectrometry. The density determined was 0.95 +/- 7% of the hulk value for the CdS. The Lorentz-Lorenz law, based upon the measured data on the index of refraction of the films, suggests a value of the density of the films close to the on e obtained in the present work.