DFT investigation of the geometrical and electronic structures of C35X (X = B, N and Si) clusters

Citation
Cg. Ding et al., DFT investigation of the geometrical and electronic structures of C35X (X = B, N and Si) clusters, EUR PHY J D, 11(1), 2000, pp. 123-126
Citations number
22
Categorie Soggetti
Physics
Journal title
EUROPEAN PHYSICAL JOURNAL D
ISSN journal
14346060 → ACNP
Volume
11
Issue
1
Year of publication
2000
Pages
123 - 126
Database
ISI
SICI code
1434-6060(200007)11:1<123:DIOTGA>2.0.ZU;2-Z
Abstract
Geometrical and electronic structures of C35X fullerenes with X = B, N and Si as substitutional dopants have been studied. Three non-equivalent sites in the D-6h structure of C-36 have been considered for the substitution. We have found that the dopant has a strong tendency to substitute at sites wh ere the carbon atom contributes significantly to the frontier orbitals of C -36 and has the weakest interaction with its nearest-neighbor atoms. The re lative stability of C35Si and C35B (C35N) has been investigated and high ch emical reactivity of C35Si has been predicted.