Or. Crasta et al., Identification and characterization of wheat-wheatgrass translocation lines and localization of barley yellow dwarf virus resistance, GENOME, 43(4), 2000, pp. 698-706
Stable introgression of agronomically important traits into crop plants thr
ough wide crossing often requires the generation and identification of tran
slocation lines. However, the low efficiency of identifying lines containin
g translocations is a significant limitation in utilizing valuable alien ch
romatin-derived traits. Selection of putative wheatgrass-wheat translocatio
n lines based on segregation ratios of progeny from gamma-irradiated seed u
sing a standard phenotypic analysis resulted in a low 4% success rate of id
entifying barley yellow dwarf virus (BYDV) resistant and susceptible transl
ocation lines. However, 58% of the susceptible progeny of this irradiated s
eed contained a Thinopyrum intermedium chromosome-specific repetitive seque
nce, which indicated that gamma-irradiation-induced translocations occurred
at high rate. Restriction fragment length polymorphism (RFLP) analysis of
susceptible lines containing alien chromatin, their resistant sister lines
and other resistant lines showed that more than one third of the progeny of
gamma-irradiated double monosomic seeds contained wheatgrass-wheat translo
cations. Genomic in situ hybridization (GISH) analysis of selected lines co
nfirmed that these were wheatgrass-wheat translocation lines. This approach
of initially identifying BYDV susceptible deletion lines using an alien ch
romosome-specific repetitive sequence followed by RFLP analysis of their re
sistant sister lines efficiently identified resistant translocation lines a
nd localized the BYDV resistance to the distal end of the introgressed Th.
intermedium chromosome.