Spin-polarized scanning electron microscopy

In this paper, a review is presented of a powerful technique for studying m agnetic microstructures: spin-polarized scanning electron microscopy, denot ed as spin-SEM, or SEMPA. When the beam of a scanning electron microscope t raverses a ferromagnetic sample, secondary electrons are emitted whose spin polarization contains information on the magnitude and direction of the ma gnetization of the surface. Various illustrative examples are presented whi ch describe the main features of the technique, such as its very high surfa ce sensitivity, its suitability for achieving complete separation of releva nt magnetic and topographic information, and its high lateral resolution.