A microheater with temperature stabilization for a scanning probe microscope

Authors
Lyulevich, VV Yaminskii, IV
Citation
Vv. Lyulevich et Iv. Yaminskii, A microheater with temperature stabilization for a scanning probe microscope, INSTR EXP R, 43(3), 2000, pp. 424-425
Citations number
5
Categorie Soggetti
Instrumentation & Measurement
Journal title
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES
ISSN journal
00204412 → ACNP
Volume
43
Issue
3
Year of publication
2000
Pages
424 - 425
Database
ISI
SICI code
0020-4412(200005/06)43:3<424:AMWTSF>2.0.ZU;2-6
Abstract
A microheater for conducting measurements by the scanning probe microscopy technique at various temperatures is described. The temperature stabilizati on accuracy is 0.05 degrees C in a range of 20-80 degrees C. A negligible t emperature drift of 40 nm/degrees C (in the sample plane) and 100 nm/degree s C (along the normal) allows the study of temperature-dependent structural changes and phase transitions in polymer materials, biological objects, an d other samples.