Ordering phenomena have a broad range of cross-cutting implications in allo
ys; aside from information on the establishment of order (short- and long-r
ange order), information can be gained on the atom-jump processes involved
as well as on the defect parameters that control ordering kinetics. Residua
l resistometry is an excellent tool with adequate ultrahigh accuracy for st
udying fine variations of order far below the order-disorder transition tem
perature or the subtle variations of short-range order corresponding to tin
y changes off he atom distribution in concentrated solid solutions outside
any long-range order phase. Residual resistometry measurements are also wel
l suited for obtaining information on how to heat-treat a material to achie
ve stable states before applying any other time-consuming method.