Hardness of bi-layer films on a leadframe substrate

Citation
Jk. Kim et al., Hardness of bi-layer films on a leadframe substrate, J MATER SCI, 35(16), 2000, pp. 4185-4192
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
35
Issue
16
Year of publication
2000
Pages
4185 - 4192
Database
ISI
SICI code
0022-2461(200008)35:16<4185:HOBFOA>2.0.ZU;2-M
Abstract
The indentation hardness and elastic modulus of leadframe materials that co nsist of Cu alloy substrate and Ni/Pd bi-layer films of differing thickness es are characterised using the micro-hardness and nano-indentation tests. T he 'true' hardness of the individual substrate and film layers is evaluated based on the empirical relationship between the measured 'composite' hardn ess and the volume of plastically deformed material of film layers. It is f ound that the composite hardness determined from the nano-indentation test increases rapidly toward a peak at extremely low indentation depth of less than about 20-30 mu m for all materials studied, due mainly to the finite v alue of the indenter tip radius and the rough surface of the specimen on th e nano-scale. The composite hardness for the coated specimens decreases wit h further increasing indentation depth toward the hardness value of the sub strate, because of the strong influence of the film/substrate interaction a nd the indentation size effect. The nano-indentation test in general gives higher true hardness values than those obtained from the micro-hardness tes t. Nevertheless, the relative hardness values of the substrate and films de termined from the two tests are consistent. The hardness of Ni film is abou t 20 to 50% greater than that of Cu alloy, whereas the hardness of Pd film is 7 to 11 times the Ni film in the nano-indentation test. (C) 2000 Kluwer Academic Publishers.