Sol-gel processing of tellurium oxide and suboxide thin films with potential for optical data storage application

Citation
Snb. Hodgson et L. Weng, Sol-gel processing of tellurium oxide and suboxide thin films with potential for optical data storage application, J SOL-GEL S, 18(2), 2000, pp. 145-158
Citations number
24
Categorie Soggetti
Material Science & Engineering
Journal title
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY
ISSN journal
09280707 → ACNP
Volume
18
Issue
2
Year of publication
2000
Pages
145 - 158
Database
ISI
SICI code
0928-0707(200005)18:2<145:SPOTOA>2.0.ZU;2-F
Abstract
A novel sol-gel processing route has been developed for the production of t ellurium oxide (TeO2) and tellurium suboxide (TeOx) thin films. The process has been used to deposit thin films on glass substrates by the dip coating process. These films have been shown to undergo thermally induced, reversi ble changes in optical properties on heating at appropriate temperatures. F ormation of TeOx was found to occur at low temperatures by direct breakdown of the sol-gel derived material even in the absence of reducing agents whi lst the principal optical effects corresponded to the formation of TeOx and alpha-TeO2 at temperatures of < 200 degrees C and < 450 degrees C respecti vely. The relatively low temperatures required to induce significant optica l effects are comparable with conventionally prepared TeOx and offer the po tential application of these materials in optical data storage systems.