An intermittent electroless nickel deposition process was examined which in
volved periodically removing and reinserting the silicon wafer in the depos
ition bath. this process results in electroless nickel deposits with a smoo
th surface appearance and uniform thickness within the bump opening. The in
termittent deposition process also results in enhancement in deposition spe
ed. The benefits of this process are ascribed to replenishment of the surfa
ce concentration and the breakdown of entrapped gas bubble in the trench ar
ea of bump pad. (C) 2000 The Electrochemical Society.