Compositional heterogeneity in ceria-based mixed oxides observed by x-ray photoelectron spectroscopy

Citation
Gw. Graham et al., Compositional heterogeneity in ceria-based mixed oxides observed by x-ray photoelectron spectroscopy, J VAC SCI A, 18(4), 2000, pp. 1093-1095
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
18
Issue
4
Year of publication
2000
Part
1
Pages
1093 - 1095
Database
ISI
SICI code
0734-2101(200007/08)18:4<1093:CHICMO>2.0.ZU;2-4
Abstract
It is argued that compositional heterogeneity in certain reducible mixed ox ides, like Ce1-xZrxO2, can be inferred from a variation in the metals ratio , as measured by x-ray photoelectron spectroscopy, between fully oxidized a nd partially reduced states of the oxide, provided that the characteristic linear dimension of the heterogeneity is at least as large as the typical e lectron inelastic mean-free path. The argument is supported by experimental results from two examples involving mixed phases, one in which the length scale is 100 nm and the other in which the domains are too small for detect ion by standard x-ray diffraction. (C) 2000 American Vacuum Society. [S0734-2101(00)01304-X].