K. Racette et al., Sputter deposition and annealing of Ta, TaSix and TaBx composite films andtheir application in next generation lithography masks, J VAC SCI A, 18(4), 2000, pp. 1119-1124
Ta and Ta composites with other elements have been developed as low stress
absorbers for x-ray mask technology. These thin films are often produced in
small quantities by sputter deposition from targets of pure Ta with chips
of the minor elements placed on the target to create the composites. For me
mbrane-mask manufacturing it is important that absorber films have uniform
composition, thickness, and low, uniform stress to assure that image size a
nd pattern placement errors are minimal. Since sputtered films containing T
a often have highly compressive stress, several methods have been used to r
educe the final stress, including careful control of sputtering conditions,
deposition of layered films with different stresses, and thermal annealing
. Much data has been reported regarding the effects of thermal annealing of
Ta films but less information is available on multiple element films such
as TaSix and TaBx. Previous reports on these materials have generally not d
iscussed the behavior of these films under long term, higher volume manufac
turing conditions. During the last several years IBM has been engaged in de
velopment and fabrication of refractory x-ray membrane masks using Ta compo
sites as absorber materials. Films were sputter deposited from hot isostati
cally pressed powder targets of Ta, Si, and B using an S-gun magnetron clus
ter deposition system. This article reports on the deposition and annealing
of these films and their application to membrane-mask fabrication in a man
ufacturing environment. The effects of deposition parameters such as de pow
er, argon gas pressure, and substrate composition on film stress, compositi
on, and density are discussed. The results of nitrogen annealing on TaSix a
nd TaBx films are presented. Absorber film quality data and its impact on i
mage size, image placement, and defect density of some x-ray masks is prese
nted. (C) 2000 American Vacuum Society.
[S0734-2101(00)05604-9].